Boundary Scan

Test Solutions Designed for Maximum Fault Coverage

Boundary Scan represents an important complementary test technology for maximization of test coverage, because many devices with modern housing types, e.g. BGA's can't be accessed anymore. Similarly, pure digital devices can be tested using JTAG with our Analog In-Circuit test / Manufacturing defect analyzers of the LEON series.

Boundary-scan technology can be applied to the whole product life cycle including product design, prototype debugging, production, and field service. This means the cost of the boundary-scan tools can be amortized over the entire product life cycle, not just the production phase thus maximizing throughputs.


Unique Value Propositions at konrad technologies


Save time with boundary scan test solutions.

JTAG Embedded Functional Test

Embedding boundary scan and functional test enable the ease-of-use and low cost of boundary-scan with the coverage and security of traditional functional testing. it also provides extended fault coverage to further complement or replace ICT testing.



  • Reusable Test Vectors
  • Reduces Cost
  • Reduced Test Time
  • Reduced Time to Market
  • Faster Return on investment as JTAG test system can provide the new area of opportunity to service a new business thus the break-even for investments into JTAG systems is much faster for our customers.
  • Reduced Design Iterations given that our test solutions are based on standard Konrad Technologies test platforms which are easy to maintain and upgrade
  • Diagnosing structural failures using the functional test is difficult compared to the boundary scan test technique. Switching from ICT to JTAG test systems will significantly reduce test time.

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