Boundary Scan represents an important complementary test technology for maximization of test coverage, because many devices with modern housing types, e.g. BGA's can't be accessed anymore. Similarly, pure digital devices can be tested using JTAG with our Analog In-Circuit test / Manufacturing defect analyzers of the LEON series.
Boundary-scan technology can be applied to the whole product life cycle including product design, prototype debugging, production, and field service. This means the cost of the boundary-scan tools can be amortized over the entire product life cycle, not just the production phase thus maximizing throughputs.
Save time with boundary scan test solutions.
JTAG Embedded Functional Test
Embedding boundary scan and functional test enable the ease-of-use and low cost of boundary-scan with the coverage and security of traditional functional testing. it also provides extended fault coverage to further complement or replace ICT testing.