Achieving maximum test coverage cost efficiently is the most important goal in electronic production. Factors like production volume, time-to-market, product complexity, combined with technical capabilities including mixed-signal, RF, digital protocols and others are important when selecting the correct test platform.
The LEON Gen III test system is designed to integrate all necessary test technologies depending on the current test requirements. This includes analog In-circuit test, boundary scan test, functional test, RF test, In-system programming and Vision inspection. The system can easily be upgraded if the product changes or if the production logistics needs to be changed, e.g from manual testing to an in-line production due to increased manufacturing volume.
Complete Platform for Test System Development
From interactive measurements using the universal instrument KT PXI-501 to integrated test systems for functional test, in-circuit test, boundary scan test, vision inspection test, communication test in wireless applications and semiconductor test, Konrad Technologies offers a complete test platform based on standard instrumentation hardware and software from leading companies. These standard products are complemented by KT hardware and software tools to ensure high performance and cost efficiency in every customized test solution.