LEON System Architecture

Smart Architecture and Cost Effective Configurations

The LEON Gen III test platform is built around the KT PXI-501 universal instrument operating as the system’s core module. It combines all necessary measurement functions for high performance PCB test on a single PXI board. Complementing the KT PXI-501 with the available 1500+ PXI products available on the market today- a powerful and cost effective test system which can be easily configured for:

  • Manufacturing Defect Analysis (MDA)
  • Analog In-circuit Test (ICT)
  • Digital Test using Boundary Scan Technology
  • Vision Test combined with electronic component testing
  • Functional Test
  • Micro contacting board testing (10-micron accuracy)

 

Maximum Test Coverage

Achieving maximum test coverage cost efficiently  is the most important goal in electronic production. Factors like production volume, time-to-market, product complexity, combined with technical capabilities including mixed-signal, RF, digital protocols and others are important when selecting the correct test platform.

The LEON Gen III test system is designed to integrate all necessary test technologies depending on the current test requirements. This includes analog In-circuit test, boundary scan test, functional test, RF test, In-system programming and Vision inspection. The system can easily be upgraded if the product changes or if the production logistics needs to be changed, e.g from manual testing to an in-line production due to increased manufacturing volume.

Complete Platform for Test System Development

From interactive measurements using the universal instrument KT PXI-501 to integrated test systems for functional test, in-circuit test, boundary scan test, vision inspection test, communication test in wireless applications and semiconductor test, Konrad Technologies offers a complete test platform based on  standard instrumentation hardware and software from leading companies. These standard products are complemented by  KT hardware and software tools  to ensure high performance and cost efficiency in every customized test solution.

 

Maximum Flexibility

The LEON Gen III platform is the perfect choice for high-speed multiple PCB panel testing applications where parallel test capabilities are required. Up to 16 embedded PCB test modules can operate in a single system, operating fully independently. Every KT PXI-501 embedded single-board PCB tester acts as a “Tester-on-the-Board”, delivering maximum speed and flexibility.

Applications

LEON Gen III test platform is built around the KT PXI-501 – it combines all necessary measurement functions for high performance PCB test on a single PXI Board. It can be configured for:

  • Manufacturing Defect Analysis (MDA)
  • Analog In-Circuit Test (ICT)
  • Functional Test (FCT)
  • Digital Test (using Boundary Scan Technology)
  • Vision Test combined with electronic component testing
  • Micro contacting board testing (10-micron accuracy)

System Interface

Over the years, inboard testing multiple different hardware interfaces have been developed from the major board test equipment manufacturers. Virtually every tester manufacturer created its own interface resulting in many incompatible industrial standards.

With the LEON Gen III platform we offer many fixture options, including:

  • Virginia Panel based KT-DUT interface
  • KT Pogo-Pin based Test Interface
  • Compatibility to existing Teradyne (GenRad) and Z18xx test systems
  • Combination with Konrad Fine Pitch Contacting fixture KT-MCS-500
  • Cable Interface
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