PXI-based ICT and FCT Test Platform LEON Gen III

In the past, traditional PCB manufacturing test was dominated by dedicated in-circuit test systems as the prime test technology. Today, the modular instrumentation platform PXI has been developed with thousands of modules for almost all kinds of measurement problems. We develop high performance board test systems based on the PXI platform, which features fast computing power, fast bus systems and additional test capabilities for functional test, boundary scan test (JTAG), AOI test and RF test etc.

KT LEON Gen III PCB Tester combines:

  • Classical Analog In-Circuit Testing (ICT)
  • Manufacturing Defect Analysis (MDA)
  • Including additional Function Test (FCT) capabilities on a single PXI Board
  • Also, multiple embedded testers can be configured in a single system for higher throughput

Highlights

  • Combined test system
  • ICT, FCT
  • Digital test using JTAG
  • In-system programming
  • Open and flexible platform
  • Small footprint
  • Combines up to 6 instruments
  • 2xPMU, 1xDVM, 1xHVCs
  • 4xADC, 4x DAC
  • High Speed Test Execution
  • Parallel Test with max 16 modules
  • Automated test sequencing
  • Custom extension modules
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